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microscopy
fabrication
spectroscopy
soft matter

EDS on TEM

Description: Oxford instruments, INCA Energy TEM 250
Location: JEOL 2010F - Chapman B26C
Uses:

Obtain site specific semi-quantitative elemental analysis of samples.

Specifications:

Silicon drift detector
80mm2 detector area with 129 eV or better energy resolution
Excellent low energy performance and the ability to detect elements down to Be.
INCA energy software is based around a Navigator and can be run on the Analyser, Point and ID and Mapping mode.
INCA Energy TEM 250 is installed on the JEOL 2010F TEM.

Download Operating Procedure