Ellipsometer
Location: Chapman Hall - B04
Uses:
Allows a very precise determination of film thicknesses when the optical constants of the films are known.
Specifications:Spectral Range: 250-2300 nm, 250-1700 nm at angles 20° to 90°; 1700-2300 nm at angles 35° to 90°
Focusing optics are available to reduce the beam size to 100 mm for wavelengths between 250-1700 nm and angles between 20°-90°
