SEM

Description: Hitachi S-4700 Cold Cathode Field Emission Scanning Electron Microscope
Location: Chapman Hall - 030A
Uses:

Obtain a three dimensional image of a sample on the nanometer to micron scale.

Specifications:

The Hitachi S-4700 SEM is equipped with a snorkel lens that allows for both an upper through-the-lens (TTL) detector and a lower Everhart-Thornley (E-T) detector.

Accelerating voltage = 0.5 to 30 kV
Magnification up to 500,000x
Resolution of: 1.5nm at 15kV accelerating voltage and 12mm working distance 2.5nm at 1kV accelerating voltage and 2.5mm working distance

Download Operating Procedure