Location: Chapman Hall - 030C
Allows the user to determine the elemental composition of the top ~10 nm of the sample surface.Specifications:
The Kratos Axis Supra x-ray photoelectron spectrometer (XPS) is equipped with monochromatic Al and Ag sources, and includes the Brite source for higher signal small spot spectroscopy. A helium lamp is included for ultraviolet photoelectron spectroscopy (UPS) work. The ion gun for sputtering is capable of delivering traditional Ar+ ions and also gas cluster argon ions for more gentle sputtering resulting in less sample damage. An air sensitive sample holder allows samples to be transferred from a third party glove box to the entry port of the XPS without exposure to air.
If you publish a paper that includes data acquired using the CHANL XPS system, please include the following in the acknowledgement section of your paper:
"This work was performed in part at the Chapel Hill Analytical and Nanofabrication Laboratory, CHANL, a member of the North Carolina Research Triangle Nanotechnology Network, RTNN, which is supported by the National Science Foundation, Grant ECCS-2025064, as part of the National Nanotechnology Coordinated Infrastructure, NNCI. A portion of this work was performed using XPS/UPS/IPES instrumentation supported by the Center for Hybrid Approaches in Solar Energy to Liquid Fuels (CHASE), an Energy Innovation Hub funded by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Award Number DE-SC0021173."