FACILITIES

CHANL’s instrumentation and office spaces are located throughout Chapman Hall with approximately 6,600 sq. ft of combined lab space, including a 2,200 sq ft cleanroom (Class 100 and 1000)

Other Chemistry Cores include:

Mass Spectrometry
Nuclear Magnetic Resonance
X-ray Crystallography
Electronics

MICROSCOPY

Scanning Electron Microscopy (SEM) – Hitachi S-4700 with EDS

Scanning Electron Microscopy (SEM) – FEI Helios 600 Nanolab with EDS

Transmission Electron Microscopy (TEM) – Thermo Scientific Talos F200X with EDS

Atomic Force Microscopy (AFM) – Bruker nanoIR3 – contact Joanna Atkin for support on the IR portion of this tool

Atomic Force Microscopy (AFM) – Asylum Research MFP3D

Nanoindenter – Optics11 Piuma

Specimen Prep

FIB lift-out Nanomanipulator – FEI EasyLift

Cryo Ultramicrotome – Leica EM UC7

Critical Point Dryer

Sputter Coater – Cressington 108 Auto

FABRICATION

Thin film deposition

Atomic Layer Deposition (ALD) – Veeco/Cambridge Nanotech Savannah S200

Plasma Enhanced Chemical Vapor Deposition (PECVD) – Advanced Vacuum Vision 310

E-beam evaporation – KJL PROLine PVD 75

E-beam evaporation – Thermionics VE100

Metal Sputtering – KJL PVD 75

Reactive Ion Etching

Deep Reactive Ion Etching (DRIE) – Alcatel AMS 100

Lithography

Mask Aligner – Karl Suss MA6/BA6

E-beam lithography – NPGS on FEI Helios FIB and Hitachi SEM

Maskless Laser writer – Heidelberg Instruments DWL 66FS

Surface Patterning

Focused Ion Beam (FIB) – FEI Helios 600 Nanolab

Cleanroom Metrology

Stylus Profilometry – KLA-Tencor P-6

Reflectometry – F50 Thin Film Mapper

Optical Microscopy – Nikon Eclipse LV150

Additional resources

Dicing Saw – Disco 3240
Oxygen Plasma Cleaner – Glow Research
Wet benches
Spin coater
Hot plates
Orbital shaker
Photoresist Laminator

SPECTROSCOPY

X-ray Photoelectron Spectroscopy (XPS) – Kratos Axis Supra

Ultraviolet Photoelectron Spectroscopy (UPS) – on Kratos XPS

Microspectrophotometry (MSP) – Craic 20/30 PV

Fourier Transform Infrared (FTIR) – Bruker Optics Hyperion 1000 with Tensor 27

Atomic Force-Infrared (AFM-IR) – Bruker nanoIR3 – contact Joanna Atkin for support

Spectroscopic Ellipsometry – J.A. Woollam VASE

Energy Dispersive Spectroscopy (EDS) – Oxford Instruments, INCA PentaFET

X-ray Diffraction (XRD) – Rigaku SmartLab

Helium Leak Detector – Agilent PD03

OTHER SPECTROSCOPY CORES

Mass Spectrometry

Nuclear Magnetic Resonance

X-ray Crystallography

SOFT MATTER

 

MALDI-ToF – Bruker UltrafleXtreme

Hybrid DMA/Rheometer – TA Instruments HR30

Differential Scanning Calorimeter – TA Instruments DSC250

Thermogravimetric Analyzer – TA Instruments TGA5500

Universal Mechanical Tester – Instron SC4-1

Nanoindenter – Optics 11 Piuma (located in the CHANL Microscopy Core Lab)