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microscopy
fabrication
spectroscopy

TEM - 200kV

Description: TEM JEOL 2010F-FasTEM
Location: Chapman Hall - B26C
Uses:

To obtain high resolution transmission electron, HRTEM, images of materials.

Specifications:

JEOL 2010F FasTEM is a HRTEM with a Zirconated tungsten thermal field emmision tip. The scope is equipped with a 2K X 2K Gatan CCD bottom mount camera.

Accelerating voltage = Variable kV, 80, 100, 120, 200kV
Operation Modes: Bright Field, Dark Field, STEM and Diffraction.
Magnification: STD Mag mode: 2kX-1.2 million X
Resolution: TEM: 1Å, lattice, and 2.3Å, point to point
Resolution: STEM: 2.3Å, point to point
Sample Holder: JEOL Single and Double tilt analytical stage, single specimen.
Tilt Angle: ± 20°

Download Operating Procedure